Parts By NSN 5962-01-075-7605
Item Name: Microcircuit Memory |
FSG: 59 Electrical and Electronic Equipment Components |
FSC Name: 5962 Microcircuits Electronic |
CAGE Code: 82577, 18324, 34371, 01295, 50364 |
NIIN: 010757605 |
NCB Code: USA (01) |
Manufacturers: raytheon company , philips semiconductors ltd , intersil corporation , texas instruments incorporated , mmi inc |
NSN 5962-01-075-7605 assigned to Microcircuit Memory manufactured by Raytheon Company, Philips Semiconductors Ltd, Intersil Corporation, Texas Instruments Incorporated, Mmi Inc. Listed below are the available items with the NSN 5962-01-075-7605, along with the related parts. Please submit an instant RFQ form to receive a competitive quote within 15 minutes.
Part No | Manufacturer | Item Name | QTY | RFQ |
---|---|---|---|---|
932820-206 | raytheon company | microcircuit memory | Avl | RFQ |
82S129W | philips semiconductors ltd | microcircuit memory | Avl | RFQ |
HM9-7611-2 | intersil corporation | microcircuit memory | Avl | RFQ |
SN92911W-206 | texas instruments incorporated | microcircuit memory | Avl | RFQ |
CC5193-206 | philips semiconductors ltd | microcircuit memory | Avl | RFQ |
MM5301 1F | mmi inc | microcircuit memory | Avl | RFQ |
17757 | mmi inc | microcircuit memory | Avl | RFQ |
B2054-206 | intersil corporation | microcircuit memory | Avl | RFQ |
SN54S287W | texas instruments incorporated | microcircuit memory | Avl | RFQ |
MRC | Criteria | Characteristic |
---|---|---|
ADAU | BODY HEIGHT | 0.085 INCHES MAXIMUM |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | 65.0/+150.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND MONOLITHIC AND POSITIVE OUTPUTS AND W/STORAGE AND PROGRAMMABLE AND PROGRAMMED AND SCHOTTKY AND BIPOLAR AND 3-STATE OUTPUT |
CQSZ | INCLOSURE CONFIGURATION | FLAT PACK |
CQZP | INPUT CIRCUIT PATTERN | 10 INPUT |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 5.5 VOLTS MAXIMUM POWER SOURCE |
CZEQ | TIME RATING PER CHACTERISTIC | 5.00 NANOSECONDS MINIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 35.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 10.00 NANOSECONDS MINIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT AND 89.0 |
TEST | TEST DATA DOCUMENT | B2577-932820 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
ADAQ | BODY LENGTH | 0.440 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.240 INCHES MINIMUM AND 0.325 INCHES MAXIMUM |
CQSJ | INCLOSURE MATERIAL | CERAMIC AND GLASS |
CQWX | OUTPUT LOGIC FORM | TRANSISTOR-TRANSISTOR LOGIC |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
CZER | MEMORY DEVICE TYPE | ROM |
TTQY | TERMINAL TYPE AND QUANTITY | 16 FLAT LEADS |
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