Parts By NSN 5962-01-267-8169
Item Name: Microcircuit Memory |
FSG: 59 Electrical and Electronic Equipment Components |
FSC Name: 5962 Microcircuits Electronic |
CAGE Code: 65786, 4T165, 73030, 61772, 3DTT2, A486G |
NIIN: 012678169 |
NCB Code: USA (01) |
Manufacturers: cypress semiconductor inc , nec electronics usa inc , hamilton sundstrand corporation , integrated device technology inc , pyramid semiconductor corp , paaesikunta logistiikkaosasto |
NSN 5962-01-267-8169 assigned to Microcircuit Memory manufactured by Cypress Semiconductor Inc, Nec Electronics Usa Inc, Hamilton Sundstrand Corporation, Integrated Device Technology Inc, Pyramid Semiconductor Corp. Listed below are the available items with the NSN 5962-01-267-8169, along with the related parts. Please submit an instant RFQ form to receive a competitive quote within 15 minutes.
Part No | Manufacturer | Item Name | QTY | RFQ |
---|---|---|---|---|
CY7C167 55 | cypress semiconductor inc | microcircuit memory | Avl | RFQ |
CY7C167-55DMB | cypress semiconductor inc | microcircuit memory | Avl | RFQ |
UPD2167 | nec electronics usa inc | microcircuit memory | Avl | RFQ |
795066-1 | hamilton sundstrand corporation | microcircuit memory | Avl | RFQ |
IDT6167LA55LB | integrated device technology inc | microcircuit memory | Avl | RFQ |
P4C167L-55LMB | pyramid semiconductor corp | microcircuit memory | Avl | RFQ |
10133816 | paaesikunta logistiikkaosasto | microcircuit memory | Avl | RFQ |
MRC | Criteria | Characteristic |
---|---|---|
ADAT | BODY WIDTH | 0.290 INCHES NOMINAL |
AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
ADAQ | BODY LENGTH | 0.425 INCHES NOMINAL |
ADAU | BODY HEIGHT | 0.065 INCHES NOMINAL |
AFJQ | STORAGE TEMP RANGE | 65.0/+150.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | HERMETICALLY SEALED AND BURN IN AND ELECTROSTATIC SENSITIVE AND MONOLITHIC AND W/ENABLE |
CQSZ | INCLOSURE CONFIGURATION | LEADLESS FLAT PACK |
CQZP | INPUT CIRCUIT PATTERN | 17 INPUT |
CZEQ | TIME RATING PER CHACTERISTIC | 55.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 55.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
TTQY | TERMINAL TYPE AND QUANTITY | 20 LEADLESS |
CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
CSWJ | (NON-CORE DATA) WORD QUANTITY | 16384 |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | 7.0 VOLTS MAXIMUM POWER SOURCE |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CZER | MEMORY DEVICE TYPE | RAM |
AEHX | MAXIMUM POWER DISSIPATION RATING | 1.0 WATTS |
CRHL | (NON-CORE DATA) BIT QUANTITY | 16384 |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
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